A look into life sciences: more than a side step from industrial inspection?

Theo Lasser; Tiemo Anhut; Alexandre Serov; Kai Hassler; Ramachandra Rao; Marcel Leutenegger; Adrian von Muehlenen; Rodrigue Chatton; Patrik W. Hoffmann; Ivo Utke; Radivoje Popovic; Pierre-Andre Besse; Alexis Rochas; Michael Gosch; Rudolf Rigler; Robert Brunner

doi:10.1117/12.508363

30 May 2003 A look into life sciences: more than a side step from industrial inspection?

Theo Lasser, Tiemo Anhut, Alexandre Serov, Kai Hassler, Ramachandra Rao, Marcel Leutenegger, Adrian von Muehlenen, Rodrigue Chatton, Patrik W. Hoffmann, Ivo Utke, Radivoje Popovic, Pierre-Andre Besse, Alexis Rochas, Michael Gosch, Rudolf Rigler, Robert Brunner

Author Affiliations +

Proceedings Volume 5144, Optical Measurement Systems for Industrial Inspection III; (2003) https://doi.org/10.1117/12.508363
Event: Optical Metrology, 2003, Munich, Germany

Abstract

Monitoring biological relevant reactions on the single molecule level by the use of fluorescent probes has become one of the most promising approaches for understanding a variety of phenomena in living organisms. By applying techniques of fluorescence spectroscopy to labelled molecules a manifold of different parameters becomes accessible i.e. molecular dynamics, energy transfer, DNA fingerprinting, etc... can be monitored at the molecular level. However, many of these optical methods rely on oversimplified assumptions, for example a three-dimensional Gaussian observation volume, perfect overlap volume for different wavelength, etc. which are not valid approximations under many common measurement conditions. As a result, these measurements will contain significant, systematic artifacts, which limit their performance and information content. Based on Fluorescence Correlation Spectroscopy (FCS) and Fluorescence Lifetime Spectroscopy we will present representative examples including a thorough signal analysis with a strong emphasis on the underlying optical principles and limitations. An outlook to biochip applications, parallel FCS and parallel Lifetime measurements will be given with cross links to optical concepts and technologies used in industrial inspection.

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Theo Lasser, Tiemo Anhut, Alexandre Serov, Kai Hassler, Ramachandra Rao, Marcel Leutenegger, Adrian von Muehlenen, Rodrigue Chatton, Patrik W. Hoffmann, Ivo Utke, Radivoje Popovic, Pierre-Andre Besse, Alexis Rochas, Michael Gosch, Rudolf Rigler, and Robert Brunner "A look into life sciences: more than a side step from industrial inspection?", Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); https://doi.org/10.1117/12.508363

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