Grid-pattern design for fast scene reconstruction by a 3D vision sensor

Qiu Guan; ShengYong Chen; Wanliang Wang; Y. F. Li

doi:10.1117/12.612494

13 June 2005 Grid-pattern design for fast scene reconstruction by a 3D vision sensor

Qiu Guan, ShengYong Chen, Wanliang Wang, Y. F. Li

Proceedings Volume 5856, Optical Measurement Systems for Industrial Inspection IV; (2005) https://doi.org/10.1117/12.612494
Event: Optical Metrology, 2005, Munich, Germany

Abstract

This paper presents a method of pattern design for a 3D vision sensor, which is based on the principles of color-encoded structured light, to improve the reconstruction efficiency. Since an ordinary structured light system using an LCD projector needs to take several images (usually 8-12 images) for recovering the 3D scene, as a result its speed is limited and applications are restricted in acquisition of static environment. For dynamic cases, the 3D measurement is desired to only capture a single image. To realize this, a new method is to use a color projector which can be controlled by a computer to generate arbitrary desired color patterns. A problem of the color encoded projection is the unique indexing of the light codes in the image. It is essential that each light grid be uniquely identified by incorporating the local neighborhoods in the light pattern so that 3D reconstruction can be performed with only local analysis of the single image. This paper proposes a method in design of such grid patterns. Experiments are provided to demonstrate the proposed method with two, three, and four different colors. The maximum possible square matrices are illustrated.

Citation Download Citation

Qiu Guan, ShengYong Chen, Wanliang Wang, and Y. F. Li "Grid-pattern design for fast scene reconstruction by a 3D vision sensor", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); https://doi.org/10.1117/12.612494

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KEYWORDS

Projection systems

Cameras

3D image processing

Structured light

3D metrology

3D vision

Sensors

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