Paper
18 August 2005 Site conditions for high resolution surface analytical systems and environmental influence on instrument performance
Bernd Guenther, A. Feltz, T. Berghaus, A. Bettac
Author Affiliations +
Abstract
The increasing performance of high resolution surface analytical instruments, in the nanometer range, requires suitable site conditions, in order to achieve the design performance specifications. Due to our practical experience in selling these instruments over the last twenty years we have established a well defined procedure, which is used for the characterisation of new instruments, as well as for the assessment of customer site conditions.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernd Guenther, A. Feltz, T. Berghaus, and A. Bettac "Site conditions for high resolution surface analytical systems and environmental influence on instrument performance", Proc. SPIE 5933, Buildings for Nanoscale Research and Beyond, 593302 (18 August 2005); https://doi.org/10.1117/12.617365
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KEYWORDS
Scanning electron microscopy

Acoustics

Buildings

Magnetism

Scanning tunneling microscopy

Calibration

Electron microscopes

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