Paper
6 December 2006 Multi-channel amplitude analyzer for x-ray investigations
M. D. Karetnikov, A. I. Klimov, V. I. Zaitsev
Author Affiliations +
Proceedings Volume 5943, X-ray and Neutron Capillary Optics II; 594317 (2006) https://doi.org/10.1117/12.638011
Event: X-ray and Neutron Capillary Optics II, 2004, Zvenigorod, Russian Federation
Abstract
The suggested device is implemented as one-module instrument including: a spectrometric amplifier providing superposition rejection, basic level restoration, track-and-hold functions, a precision ADC completed with the buffer memory; high-voltage power supply for X-ray detector; hardware interface with PC. All this resulted in a compact, functionally completed instrument for X-ray analysis. The device is a convenient instrument for X-ray fluorescent analysis, radiation diffraction studies, determination of element composition of a substance, customs and forensic expertise, medical diagnostics, testing of food products for presence of heavy elements, and other studies associated with X-ray applications. The functional diagram of the multi-channel amplitude analyzer is given in Fig. 1. The control circuit includes programmable logic device (PLD) EPM7128AETC100-lO manufactured by Altera Corporation, high performance C8051A021 processor by Cygnal Integrated Products and AS7C3256-12TC static memory by Cypress.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. D. Karetnikov, A. I. Klimov, and V. I. Zaitsev "Multi-channel amplitude analyzer for x-ray investigations", Proc. SPIE 5943, X-ray and Neutron Capillary Optics II, 594317 (6 December 2006); https://doi.org/10.1117/12.638011
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Signal processing

X-rays

Signal detection

Sensors

Microcontrollers

Power supplies

X-ray detectors

RELATED CONTENT

A comparison of low-speed communication modes
Proceedings of SPIE (April 21 2022)
Design and development of soft x ray diagnostics based on...
Proceedings of SPIE (November 06 2019)
Single sided x ray inspection of vehicles using AS&E's Z...
Proceedings of SPIE (December 30 2003)
Removal of trapped charge in selenium detectors
Proceedings of SPIE (March 18 2010)
Performance of detectors for x-ray crystallography
Proceedings of SPIE (December 16 1993)

Back to Top