A new method for evaluating semiconductor laser beam quality

Changqing Cao; Xiaodong Zeng; Yuying An; Qiang Xu; Zhejun Feng

doi:10.1117/12.633628

2 December 2005 A new method for evaluating semiconductor laser beam quality

Changqing Cao, Xiaodong Zeng, Yuying An, Qiang Xu, Zhejun Feng

Proceedings Volume 6020, Optoelectronic Materials and Devices for Optical Communications; 60202H (2005) https://doi.org/10.1117/12.633628
Event: Asia-Pacific Optical Communications, 2005, Shanghai, China

Abstract

Beam quality is very important in laser technology and its application. In practice a good beam quality evaluating method can indicate which beam is good and which laser is suitable. Therefore evaluating beam quality is of huge significance. Because the beam of laser diode has many characteristics differ from other lasers, such as the angle of the beam is too big, and the angle in the direction parallel to the junction plane disagrees with it in the perpendicular direction, a new quality parameter Q(θ,ω,d) for evaluating beam quality of laser diode is given. The difficulty of collimation is well expressed by use of Q. The smaller the value of Q is, the more easily the beam is collimated.

Citation Download Citation

Changqing Cao, Xiaodong Zeng, Yuying An, Qiang Xu, and Zhejun Feng "A new method for evaluating semiconductor laser beam quality", Proc. SPIE 6020, Optoelectronic Materials and Devices for Optical Communications, 60202H (2 December 2005); https://doi.org/10.1117/12.633628

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