Hybrid Infrared Scene Projector (HIRSP): a high dynamic range infrared scene projector

Thomas M. Cantey; D. Brett Beasley; Jim Buford; Hajin Kim; Gary Ballard

doi:10.1117/12.725632

30 April 2007 Hybrid infrared scene projector (HIRSP): a high dynamic range infrared scene projector

Thomas M. Cantey, D. Brett Beasley, Jim Buford, Hajin Kim, Gary Ballard

Proceedings Volume 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII; 654409 (2007) https://doi.org/10.1117/12.725632
Event: Defense and Security Symposium, 2007, Orlando, Florida, United States

Abstract

Currently, no infrared scene projector technology has the ability to completely simulate the real-world, high dynamic range temperatures encountered by modern infrared imagers. This paper presents the merging of two infrared scene technologies in an effort to develop the first truly high dynamic range infrared scene projector. The observed dynamic range capability simulates 250 Kelvin apparent background temperature to 1273 Kelvin maximum apparent temperature. The research combines the technologies of an emissive resistor array device and an optically scanned quantum well diode laser array projector. The high apparent temperature simulations are the direct result of luminescent infrared radiation emitted by the diode lasers. The simulation of low background apparent temperatures was obtained by enclosing the entire projector system in an environmental chamber operating at -40 °Celsius. The apparent temperature of the hybrid infrared scene projector was analytically calculated and compared to the measured results. Sample imagery from the high dynamic range infrared scene projector is furnished in the conclusion along with the final applicability of the hybrid approach.

Citation Download Citation

Thomas M. Cantey, D. Brett Beasley, Jim Buford, Hajin Kim, and Gary Ballard "Hybrid infrared scene projector (HIRSP): a high dynamic range infrared scene projector", Proc. SPIE 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII, 654409 (30 April 2007); https://doi.org/10.1117/12.725632

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