Technical issues in the development of scene-projection systems for sensor calibration, characterization, and HWIL testing at AEDC

H. S. Lowry; M. F. Breeden; D. H. Crider; S. L. Steely; R. A. Nicholson; J. M. Labello

doi:10.1117/12.776884

16 April 2008 Technical issues in the development of scene-projection systems for sensor calibration, characterization, and HWIL testing at AEDC

H. S. Lowry, M. F. Breeden, D. H. Crider, S. L. Steely, R. A. Nicholson, J. M. Labello

Author Affiliations +

Proceedings Volume 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII; 69420M (2008) https://doi.org/10.1117/12.776884
Event: SPIE Defense and Security Symposium, 2008, Orlando, Florida, United States

Abstract

The characterization, calibration, and mission simulation testing of space-based, interceptor, and airborne sensors require a continual involvement in the development and evaluation of radiometric projection technologies. Recent efforts at the Arnold Engineering Development Center (AEDC) include hardware-in-the-loop (HWIL) testing with high-fidelity, complex scene projection technologies integrated into a low-cryovacuum (~20 K) environment as well as improvements in the radiometric source calibration systems. The latest scene simulation and projection technologies are being investigated, technologies that can produce desired target temperatures and target-to-sensor ranges that will make it possible to evaluate sensor mission performance. These technologies include multiple-band source subsystems and special spectral tailoring methods, as well as comprehensive analysis and optical properties measurements of the components involved. This paper discusses the implementation of such techniques at AEDC.

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H. S. Lowry, M. F. Breeden, D. H. Crider, S. L. Steely, R. A. Nicholson, and J. M. Labello "Technical issues in the development of scene-projection systems for sensor calibration, characterization, and HWIL testing at AEDC", Proc. SPIE 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII, 69420M (16 April 2008); https://doi.org/10.1117/12.776884

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