Projection technologies for imaging sensor calibration, characterization, and HWIL testing at AEDC

H. S. Lowry; M. F. Breeden; D. H. Crider; S. L. Steely; R. A. Nicholson; J. M. Labello

doi:10.1117/12.848945

23 April 2010 Projection technologies for imaging sensor calibration, characterization, and HWIL testing at AEDC

H. S. Lowry, M. F. Breeden, D. H. Crider, S. L. Steely, R. A. Nicholson, J. M. Labello

Proceedings Volume 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV; 766303 (2010) https://doi.org/10.1117/12.848945
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

The characterization, calibration, and mission simulation testing of imaging sensors require continual involvement in the development and evaluation of radiometric projection technologies. Arnold Engineering Development Center (AEDC) uses these technologies to perform hardware-in-the-loop (HWIL) testing with high-fidelity complex scene projection technologies that involve sophisticated radiometric source calibration systems to validate sensor mission performance. Testing with the National Institute of Standards and Technology (NIST) Ballistic Missile Defense Organization (BMDO) transfer radiometer (BXR) and Missile Defense Agency (MDA) transfer radiometer (MDXR) offers improved radiometric and temporal fidelity in this cold-background environment. The development of hardware and test methodologies to accommodate wide field of view (WFOV), polarimetric, and multi/hyperspectral imaging systems is being pursued to support a variety of program needs such as space situational awareness (SSA). Test techniques for the acquisition of data needed for scene generation models (solar/lunar exclusion, radiation effects, etc.) are also needed and are being sought. The extension of HWIL testing to the 7V Chamber requires the upgrade of the current satellite emulation scene generation system. This paper provides an overview of pertinent technologies being investigated and implemented at AEDC.

Citation Download Citation

H. S. Lowry, M. F. Breeden, D. H. Crider, S. L. Steely, R. A. Nicholson, and J. M. Labello "Projection technologies for imaging sensor calibration, characterization, and HWIL testing at AEDC", Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 766303 (23 April 2010); https://doi.org/10.1117/12.848945

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KEYWORDS

Calibration

Data modeling

Sensors

Data acquisition

Mirrors

Light emitting diodes

Projection systems

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