Paper
11 March 2008 Structural, electrical, and optical characterization of nanocrystalline diamond films deposited by HFCVD method
Yan Jin, Linjun Wang, Jianmin Liu, Jian Huang, Run Xu, Weimin Shi, Yiben Xia
Author Affiliations +
Proceedings Volume 6984, Sixth International Conference on Thin Film Physics and Applications; 698417 (2008) https://doi.org/10.1117/12.792389
Event: Sixth International Conference on Thin Film Physics and Applications, 2007, Shanghai, China
Abstract
The structure, electrical and optical properties of nano-crystalline diamond (NCD) films deposited by hot-filament chemical vapor deposition (HFCVD) method, are reported. The influence of the carbon concentration during the film deposition on the Raman scattering, optical gap, optical constants (n and k) and dark-current is investigated. Under a higher carbon concentration during deposition, the NCD film obtained with a smaller grain size, has a lower optical gap, refractive index and electrical resistivity. These changes with the carbon concentration are attributed to the high amount of sp2 bonded carbons and other non-diamond phase, which is confirmed by Raman scattering measurements.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yan Jin, Linjun Wang, Jianmin Liu, Jian Huang, Run Xu, Weimin Shi, and Yiben Xia "Structural, electrical, and optical characterization of nanocrystalline diamond films deposited by HFCVD method", Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 698417 (11 March 2008); https://doi.org/10.1117/12.792389
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diamond

Carbon

Silicon

Raman spectroscopy

Refractive index

Atomic force microscopy

Chemical vapor deposition

Back to Top