Environmental testing of COTS components for space applications

Rajeshuni Ramesham

doi:10.1117/12.813408

9 February 2009 Environmental testing of COTS components for space applications

Rajeshuni Ramesham

Proceedings Volume 7206, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII; 72060H (2009) https://doi.org/10.1117/12.813408
Event: SPIE MOEMS-MEMS: Micro- and Nanofabrication, 2009, San Jose, California, United States

Abstract

Research and development of microelectromechanical systems (MEMS) has shown a significant promise for a variety of commercial applications. For example, accelerometers are widely used for air bags in automobiles, MEMS inkjet print heads are used for printers, gyroscopes for guidance and navigation and pressure sensors for various industrial applications. Some of the MEMS devices have potential to become the commercial-off-the-shelf (COTS) components. Aerospace requires more sophisticated technology development to achieve significant cost savings if they could utilize COTS components in their systems. A miniature gas chromatograph instrument designed as a space station project will provide onorbit detection, identification, and quantification of potentially toxic trace volatile organic compounds in the human-supporting environment. The instrument consists of several commercial off-the-shelf (COTS) valves, pumps and sensors. This paper describes the thermal environmental requirements and protoflight/qualification thermal test results for the COTS parts at cold and hot temperature extremes. The objective of this study is to qualify several COTS components for specific thermal/dynamic environments to assess their reliability. All COTS components life tested were believed to meet the 3x mission operational life requirements. Test results will be presented.

Citation Download Citation

Rajeshuni Ramesham "Environmental testing of COTS components for space applications", Proc. SPIE 7206, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII, 72060H (9 February 2009); https://doi.org/10.1117/12.813408

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