Preparation and optical properties of polycrystalline HgI2 thin films utilizing vertical deposition technique of chemistry

Jie Zhou; Weimin Shi; Guangpu Wei; Juan Qin; Linjun Wang; Jieli Chen

doi:10.1117/12.888249

18 February 2011 Preparation and optical properties of polycrystalline HgI₂ thin films utilizing vertical deposition technique of chemistry

Jie Zhou, Weimin Shi, Guangpu Wei, Juan Qin, Linjun Wang, Jieli Chen

Author Affiliations +

Proceedings Volume 7995, Seventh International Conference on Thin Film Physics and Applications; 799523 (2011) https://doi.org/10.1117/12.888249
Event: Seventh International Conference on Thin Film Physics and Applications, 2010, Shanghai, China

Abstract

Mercuric Iodide (HgI₂) is a promising semiconductor material for nuclear radiation detectors working at room temperature, especially for x-ray and γ-ray detectors. The influences of different growth temperatures on qualities of thin films were studied. The structure and optical properties of thin films were characterized by x-ray diffraction spectroscopy, metallography and UV-VIS spectrophotometer. Our results can be summarized as following: XRD analysis shows crystallinity of HgI₂ in thin films depends mainly on the growth temperatures, that is, the XRD reflections become stronger with the decrease of the growth temperature. The optimum growth temperature for preparation of polycrystalline HgI₂ thin film utilizing vertical deposition technique of chemistry is about 20°C. The corresponding thin film has a good uniformity with thickness of about 800 nm, perpendicular to the substrate along <001> direction. Based on its optical performance testing, our calculations found that HgI₂ thin film grown at 20°C has a wide energy band gap of about 2.26 eV.

Citation Download Citation

Jie Zhou, Weimin Shi, Guangpu Wei, Juan Qin, Linjun Wang, and Jieli Chen "Preparation and optical properties of polycrystalline HgI₂ thin films utilizing vertical deposition technique of chemistry", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 799523 (18 February 2011); https://doi.org/10.1117/12.888249

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available