Modeling Fizeau interferometer based on ray tracing with Zemax

Yiwei He; Xi Hou; Yongqian Wu; Fan Wu; Haiyang Quan; Fengwei Liu

doi:10.1117/12.2197612

8 October 2015 Modeling Fizeau interferometer based on ray tracing with Zemax

Yiwei He, Xi Hou, Yongqian Wu, Fan Wu, Haiyang Quan, Fengwei Liu

Proceedings Volume 9677, AOPC 2015: Optical Test, Measurement, and Equipment; 96770G (2015) https://doi.org/10.1117/12.2197612
Event: Applied Optics and Photonics China (AOPC2015), 2015, Beijing, China

Abstract

A convenient method to study the influence of error sources in Fizeau is to build a ray-tracing model to simulate the error sources. In this paper an interferometer model is presented; an extension program is called to simulate the interference; and a preliminary research of several error sources is conducted. These examples demonstrate error analysis based on interferometer models is feasible and provide some guidance for optimizing our interferometer design.

Citation Download Citation

Yiwei He, Xi Hou, Yongqian Wu, Fan Wu, Haiyang Quan, and Fengwei Liu "Modeling Fizeau interferometer based on ray tracing with Zemax", Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96770G (8 October 2015); https://doi.org/10.1117/12.2197612

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