X-Ray Imaging Spectroscopy With EEV CCDS

David H Lumb; Andrew D Holland

doi:10.1117/12.948708

21 December 1988 X-Ray Imaging Spectroscopy With EEV CCDS

David H Lumb, Andrew D Holland

Proceedings Volume 0982, X-Ray Instrumentation in Astronomy II; (1988) https://doi.org/10.1117/12.948708
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

The requirements for CCDs which may be used in future X-ray astronomical missions are discussed. Results from a programme designed to enhance commercially available CCDs for X-ray spectroscopic applications are presented. The use of deep depletion technology allows a combination of good X-ray detection efficiency (> 50% at 6 keV) and X-ray energy resolution (e, 100eV FWHM). The effects on the scientific performance of a radiation dose of as little as 14 krads are shown to be potentially serious. Further developments in the topics of back illumination and large area arrays are described.

Citation Download Citation

David H Lumb and Andrew D Holland "X-Ray Imaging Spectroscopy With EEV CCDS", Proc. SPIE 0982, X-Ray Instrumentation in Astronomy II, (21 December 1988); https://doi.org/10.1117/12.948708

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