Spatially resolved effects in UV LEDs with relevance for device performance and reliability

Jan Ruschel; Tim Kolbe; Jens W. Tomm; Johannes Glaab; Marcel Schilling; Sylvia Hagedorn; Jens C. Rass; Hyun K. Cho; Christoph Stölmacker; Martin Guttmann; Tim Wernicke; Markus Weyers; Michael Kneissl; Sven Einfeldt

doi:10.1117/12.3002498

9 March 2024 Spatially resolved effects in UV LEDs with relevance for device performance and reliability

Jan Ruschel, Tim Kolbe, Jens W. Tomm, Johannes Glaab, Marcel Schilling, Sylvia Hagedorn, Jens C. Rass, Hyun K. Cho, Christoph Stölmacker, Martin Guttmann, Tim Wernicke, Markus Weyers, Michael Kneissl, Sven Einfeldt

Author Affiliations +

Proceedings Volume PC12886, Gallium Nitride Materials and Devices XIX; PC1288615 (2024) https://doi.org/10.1117/12.3002498
Event: SPIE OPTO, 2024, San Francisco, California, United States

Abstract

Electrical and optical excitation of the active region of a UVB LED chip was combined while imaging its in-plane lateral light emission by a UV camera. This made it possible to distinguish between spatial distribution in current density and in efficiency of radiative recombination of charge carriers. It is demonstrated that the degradation of the active region is more prominent in the areas where the local current density increased throughout the long-term operation. It will be shown how the spatial intensity distributions in UVB and UVC LEDs are affected by the operation current, chip design, and mesa edges.

Conference Presentation

Citation Download Citation

Jan Ruschel, Tim Kolbe, Jens W. Tomm, Johannes Glaab, Marcel Schilling, Sylvia Hagedorn, Jens C. Rass, Hyun K. Cho, Christoph Stölmacker, Martin Guttmann, Tim Wernicke, Markus Weyers, Michael Kneissl, and Sven Einfeldt "Spatially resolved effects in UV LEDs with relevance for device performance and reliability", Proc. SPIE PC12886, Gallium Nitride Materials and Devices XIX, PC1288615 (9 March 2024); https://doi.org/10.1117/12.3002498

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