1 July 2002 Structural and thermal analysis of Ag-Sb-Te alloy and its films for phase change optical memories
Yagya Deva Sharma, Promod K. Bhatnagar
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An Ag-Sb-Te alloy and its films are prepared as a new optical recording amorphous crystalline (a?c) phase transformation material. The crystallization process of Ag-Sb-Te films is systematically studied through measurement of recording characteristics to solve the trade-off problem between data (amorphous) stability and erasing sensitivity. phase change optical recording disks demonstrate long thermal stability of the amorphous recording marks. The crystallization process of Ag- Sb-Te material was studied using differential thermal analysis (DTA), and the nature of the material was studied by x-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM), respectively. The films were studied for both cases of before and after annealing. It was concluded that the alloy (Ag-Sb-Te) could be used as a phase change optical memory material.
©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)
Yagya Deva Sharma and Promod K. Bhatnagar "Structural and thermal analysis of Ag-Sb-Te alloy and its films for phase change optical memories," Optical Engineering 41(7), (1 July 2002). https://doi.org/10.1117/1.1481897
Published: 1 July 2002
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Cited by 2 scholarly publications.
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KEYWORDS
Silver

Antimony

Crystals

Tellurium

Glasses

Annealing

X-ray diffraction

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