Abhinav Saxena
at BITS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 January 2005 Paper
Ashutosh Shukla, Abhinav Saxena, Bhavesh Neekhra, Raman Balasubramanian, Krishnan Swaminathan
Proceedings Volume 5675, (2005) https://doi.org/10.1117/12.584221
KEYWORDS: Error analysis, Cameras, Imaging systems, 3D image processing, Reconstruction algorithms, Image processing, 3D image reconstruction, Mathematics, 3D metrology, Inspection

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