Mr. Akira Hokazono Profile

Akira Hokazono

at KIOXIA Corp

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Publications (1)

Proceedings Article | 10 April 2024 Presentation + Paper

Transistor profiling for quantitative evaluation of variability in transistor characteristics due to layout dependent effects (LDEs)

Chikaaki Kodama, Mikiyasu Yamaji, Hiroshi Kitahara, Akira Hokazono, Shigeki Nojima, Piyush Pathak, Kimiko Ichikawa, Jac Paul Condella, Michel Cote, Ya-Chieh Lai, Philippe Hurat

Proceedings Volume 12954, 1295403 (2024) https://doi.org/10.1117/12.3010201

KEYWORDS: Transistors, Profiling, Design, Device simulation, Image classification, Matrices, Very large scale integration, Computer simulations, CMOS technology

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