Akira Hokazono
at KIOXIA Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12954, 1295403 (2024) https://doi.org/10.1117/12.3010201
KEYWORDS: Transistors, Profiling, Design, Device simulation, Image classification, Matrices, Very large scale integration, Computer simulations, CMOS technology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top