Dr. Alfonso Torres Jacome
Researcher at INAOE
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 3 November 2011 Paper
A. Orduña-Díaz, M. Rojas-López, R. Delgado-Macuil, Alfonso Torres-Jácome, F. De la Hidalga-Wade, Daniel Ferrusca, Salvador Ventura-Gonzalez, C. Treviño-Palacios
Proceedings Volume 8011, 80111V (2011) https://doi.org/10.1117/12.903349
KEYWORDS: Bolometers, Silicon, Sensors, Amorphous silicon, Microbolometers, Boron, Potassium, Thermography, Plasma enhanced chemical vapor deposition, Infrared radiation

Proceedings Article | 26 October 2011 Paper
Proceedings Volume 8011, 80114V (2011) https://doi.org/10.1117/12.902182
KEYWORDS: Waveguides, Photodetectors, Germanium, Silicon, Dielectrics, Optical interconnects, Plasma enhanced chemical vapor deposition, Silica, Semiconducting wafers, Cladding

Proceedings Article | 4 May 2010 Paper
Mario Moreno, Alfonso Torres, Andrey Kosarev
Proceedings Volume 7660, 766014 (2010) https://doi.org/10.1117/12.853561
KEYWORDS: Microbolometers, Resistance, Plasma, Electrodes, Aluminum, Metals, Solar energy, Time metrology, Temperature metrology, Silicon

SPIE Journal Paper | 1 April 2005
Arllene Perez, Carlos Zuniga, Francisco Renero Carrillo, Alfonso Torres
OE, Vol. 44, Issue 04, 043801, (April 2005) https://doi.org/10.1117/12.10.1117/1.1883698
KEYWORDS: Germanium, Amorphous silicon, Plasma enhanced chemical vapor deposition, Refractive index, Optical properties, Absorption, Glasses, Optical engineering, Chemical vapor deposition, Medium wave

Proceedings Article | 21 October 2004 Paper
Proceedings Volume 5622, (2004) https://doi.org/10.1117/12.591669
KEYWORDS: Sensors, Silicon, CMOS technology, Photodetectors, CMOS sensors, Photodiodes, Optoelectronic devices, Signal detection, Silicon films, Visible radiation

Showing 5 of 8 publications
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