Dr. Amir Avishai Profile

Dr. Amir Avishai

at Carl Zeiss X-ray Microscopy Inc

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 20 March 2020 Presentation + Paper

Jens Timo Neumann, Dmitry Klochkov, Thomas Korb, Sheetal Gupta, Amir Avishai, Ramani Pichumani, Keumsil Lee, Alex Buxbaum, Eugen Foca

Proceedings Volume 11325, 113250M (2020) https://doi.org/10.1117/12.2552006

KEYWORDS: Statistical analysis, Scanning electron microscopy, Semiconducting wafers, Logic, Data acquisition, Tomography, Shape analysis, Metrology

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Keywords/Phrases