12 In the paper, a new method of flaw evaluation in time for an organized production is presented. A statistical correlation between the number of flows, the degree of gravity, the optimum production volume, the operators qualification level and their testing charge was established. The demerit method is a statistics one based on according a number of points to the defect types as function of their gravity degree. The `demerit' (term derived from French `sans merite') represents a mediation coefficient of the defects frequency pondered according to the assigned points. The `demerit' represents a synthetic complex and complete indicator, related to the defect number as well as to their gravity level.
Beginning at observation that if a Goldthwaite diagram is draw a line (lambda) equals constant, all the curves of this diagrams are cutes in a point that are a value equal with that constant. If the constant is choose the maximum admissible value of failure rate multiplied by time of qualified life, the intersection of (lambda) line with the different (sigma) i curves, corresponding for a certain semiconductor devices, can determinate the value of median time tmi that corresponds t functioning temperature. In the laboratory was achieved accelerated aging for some semiconductor devices types. Parameters of accelerated aging were chosen so that they are not introducing any new failure mechanism non typical for normal functioning. Necessary time for accelerated aging test of this device was determinate using Arrhenius equation, for acceptance quality level 5 percent. For those devices, the time accelerated aging was determinate around on hundred hours. The value of failure rate certification was 102-103 Fits. The obtained results were validated therefore comparing then the results obtained using classical method for reliability testing, having the duration of 1000-200h. In this mode we can solve the problems of a long and expensive testing time before launching on the market a new devices.
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