Ankur Vishnoi
at Indian Institute of Technology Kanpur
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 April 2020 Paper
Proceedings Volume 11352, 113520J (2020) https://doi.org/10.1117/12.2555301
KEYWORDS: Fringe analysis, Graphics processing units, Parallel processing, Spatial frequencies, Nondestructive evaluation, Inspection, Visualization, Binary data, Computer programming, Optical metrology

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