Prof. Anthony J. Hoffman
at Univ of Notre Dame
SPIE Involvement:
Author | Student Chapter Advisor
Publications (6)

Proceedings Article | 12 March 2024 Presentation + Paper
Proceedings Volume 12878, 128780D (2024) https://doi.org/10.1117/12.3003098
KEYWORDS: Reflectivity, Diffuse reflectance spectroscopy, Laser drilling, Infrared radiation, Micromachining, Stainless steel, Thermography, Scanning electron microscopy, Laser processing, Femtosecond phenomena

Proceedings Article | 28 September 2023 Presentation + Paper
Carlos Mateo Gutierrez, Milan Palei, Cagri Aydinkarahaliloglu, Xiaoxiao Liu, Devin Sullivan, Anthony Hoffman
Proceedings Volume 12665, 1266509 (2023) https://doi.org/10.1117/12.2677399
KEYWORDS: Fiber Bragg gratings, Sensors, Light emitting diodes, Bragg wavelengths, Single mode fibers, Signal to noise ratio, Reflection, Photodiodes, Emission spectrum, Prototyping

Proceedings Article | 16 February 2017 Paper
Proceedings Volume 10100, 101001G (2017) https://doi.org/10.1117/12.2252844
KEYWORDS: Raman spectroscopy, Phonons, Nanoparticles, Polaritons, Reflection, Hybrid fiber optics, Thin films, Gold, Crystals, Dielectrics

Proceedings Article | 10 September 2013 Paper
Tahsin Ahmed, Thomas Butler, Aamir Khan, Jason Kulick, Gary Bernstein, Anthony Hoffman, Scott Howard
Proceedings Volume 8844, 88440C (2013) https://doi.org/10.1117/12.2024088
KEYWORDS: Waveguides, Quantum cascade lasers, Finite-difference time-domain method, Packaging, Integrated optics, Mid-IR, Waveguide modes, Copper, Semiconductors, Single mode fibers

Proceedings Article | 3 February 2009 Paper
Proceedings Volume 7230, 72300T (2009) https://doi.org/10.1117/12.810258
KEYWORDS: Semiconducting wafers, Quantum cascade lasers, Wafer testing, Wafer-level optics, Temperature metrology, Laser damage threshold, Electroluminescence, Lithography, Pulsed laser operation, Etching

Showing 5 of 6 publications
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