Dr. Antonela Comisso
at CNR-IFN Padova
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 14 September 2016
OE, Vol. 55, Issue 09, 095102, (September 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.9.095102
KEYWORDS: Titanium dioxide, Reflectivity, Titanium, Thin films, Silicon, X-rays, Statistical modeling, Contamination, Interfaces, Extreme ultraviolet

Proceedings Article | 12 May 2015 Paper
Proceedings Volume 9510, 95100T (2015) https://doi.org/10.1117/12.2181820
KEYWORDS: Reflectivity, Scanning electron microscopy, Extreme ultraviolet, Extreme ultraviolet lithography, Boron, Multilayers, Interfaces, X-rays, Diffusion, Grazing incidence

Proceedings Article | 12 May 2015 Paper
Proceedings Volume 9510, 95100Z (2015) https://doi.org/10.1117/12.2178142
KEYWORDS: Thin films, Reflectivity, Extreme ultraviolet, X-rays, Surface roughness, Titanium, Refractive index, Silicon, X-ray optics, Titanium dioxide

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