Bernd Heinz
Sr. Scientist at OC Oerlikon Balzers Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 June 2006 Paper
Bernd Heinz, Thomas Eisenhammer, Martin Dubs, Cem Yavaser, Thomas Pfaff
Proceedings Volume 6282, 62820G (2006) https://doi.org/10.1117/12.685201
KEYWORDS: Coating, Ultraviolet radiation, Thin film coatings, Humidity, Optical storage, Silicon, Manufacturing, Standards development, Process control, Digital video discs

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