Bin Chen
at Shanghai Xin Yue Lian Hui Electronic Technology Co., Ltd.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 August 2020 Poster + Paper
Proceedings Volume 11510, 115102A (2020) https://doi.org/10.1117/12.2565961
KEYWORDS: Clouds, Particles, Remote sensing, Image segmentation, Fractal analysis, Computer simulations, Image analysis, Image processing algorithms and systems

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