Dr. Bonghwan Chon Profile

Dr. Bonghwan Chon

Research Scientist at National Institute of Standards and Technology

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Publications (4)

Proceedings Article | 20 February 2020 Paper

Scanning offset-emission hyperspectral microscopy (SOHM) of waveguiding in single ZnO nanorod

Bonghwan Chon, Johnson Truong, Matthew Hansen, Jong-In Hahm, Young Jong Lee

Proceedings Volume 11251, 1125123 (2020) https://doi.org/10.1117/12.2542446

KEYWORDS: Zinc oxide, Waveguides, Charge-coupled devices, Nanomaterials, Polarization, Signal detection, Microscopy, Geometrical optics, Nanorods, Signal processing

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Proceedings Article | 26 April 2016 Presentation

Label-free hyperspectral microscopy for scatter imaging of biological processes in cells (Conference Presentation)

Jeeseong Hwang, Aniruddha Ray, Philip Cheney, Bonghwan Chon, Ji Youn Lee, Kimberly Briggman

Proceedings Volume 9700, 97000L (2016) https://doi.org/10.1117/12.2218639

KEYWORDS: Microscopy, Image processing, Scattering, Confocal microscopy, Hyperspectral imaging, 3D image processing, Scatter measurement, Biomedical optics, Nanoparticles, Cell death

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SPIE Journal Paper | 11 September 2015 Open Access

Digital phantoms generated by spectral and spatial light modulators

Bonghwan Chon, Fuyuki Tokumasu, Ji Youn Lee, David Allen, Joseph Rice, Jeeseong Hwang

JBO, Vol. 20, Issue 12, 121309, (September 2015) https://doi.org/10.1117/12.10.1117/1.JBO.20.12.121309

KEYWORDS: Spatial light modulators, Hyperspectral imaging, Absorption, Scattering, Liquid crystal on silicon, Image sensors, Image quality, Calibration, Reflectivity, Image analysis

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Proceedings Article | 6 March 2015 Paper

Making digital phantoms with spectral and spatial light modulators for quantitative applications of hyperspectral optical medical imaging devices

Bonghwan Chon, Fuyuki Tokumasu, Ji Youn Lee, David Allen, Joseph Rice, Jeeseong Hwang

Proceedings Volume 9325, 93250C (2015) https://doi.org/10.1117/12.2085237

KEYWORDS: Spatial light modulators, Hyperspectral imaging, Liquid crystal on silicon, Image sensors, Calibration, Reflectivity, Absorption, Imaging systems, Imaging devices, Standards development

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