Dr. Brian Arnold Profile

Dr. Brian Arnold

at Edmund Optics Inc

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 24 November 2023 Presentation

Observation and mitigation of sub-damage threshold UV laser-induced contamination on optical surfaces at 355 nm

Lucas Willis, Brian Arnold, Cyrus Rashvand, Matthew Dabney

Proceedings Volume PC12726, PC127260F (2023) https://doi.org/10.1117/12.2685255

KEYWORDS: Optical surfaces, Contamination, Laser optics, Ultraviolet radiation, Laser damage threshold, Beam path, Pulsed laser operation, Silica, Pulse signals, Optomechanical design

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Proceedings Article | 24 November 2023 Presentation

Study of beam diameter and test area effect on laser-induced damage threshold measurements in the nanosecond regime

Matthew Dabney, Brian Arnold, Cyrus Rashvand

Proceedings Volume PC12726, PC1272607 (2023) https://doi.org/10.1117/12.2685272

KEYWORDS: Laser damage threshold, Beam diameter, Optical scanning systems, Standards development, Reflectivity, Physics, Mirrors, Lasers, Laser induced damage, Laser development

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Proceedings Article | 2 December 2022 Presentation + Paper

UV fatigue of laser optics: laser-induced contamination

Brian Arnold, Cyrus Rashvand, Lucas Willis, Matthew Dabney

Proceedings Volume 12300, 123000C (2022) https://doi.org/10.1117/12.2638404

KEYWORDS: Contamination, Ultraviolet radiation, Laser optics, Laser systems engineering, Time lapse microscopy, UV optics, Laser damage threshold, Laser induced damage

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Proceedings Article | 19 November 2021 Presentation + Paper

Ultraviolet fatigue testing of laser optics

Matthew Dabney, Brian Arnold, Cyrus Rashvand

Proceedings Volume 11910, 119100P (2021) https://doi.org/10.1117/12.2598678

KEYWORDS: Ultraviolet radiation, UV optics, Mirrors, Laser optics, Transmittance, Optical testing, Laser induced damage, Optics manufacturing

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Proceedings Article | 11 September 2020 Presentation

Development of a Robust Laser Damage Threshold Testbed

Matthew Dabney, Lucas Willis, Brian Arnold, Nathan Carlie

Proceedings Volume 11514, 115140F (2020) https://doi.org/10.1117/12.2571190

KEYWORDS: Laser development, Laser damage threshold, Laser optics, Standards development, Laser induced damage, High power lasers, Feedback loops, Optical testing, Electro optics, Damage detection

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