Chayan Mitra
Manager at GE India Technology Centre Pvt Ltd
SPIE Involvement:
Author
Area of Expertise:
Tunable Diode Laser Absorption Spectroscopy , Camera based sensors , Optical sensors for harsh environment , Sensors , Mid-IR absorption spectroscopy
Websites:
Profile Summary

Manage a team working on harsh environment and emissions sensing.
Principal Investigator and Program leader for:
Laser based sensing for energy applications, Harsh environment sensor, tunable diode laser absorption spectroscopy, Mid-IR Absorption Spectroscopy, Sensors and monitoring devices for Energy and Oil & Gas applications.

I'm certified Six Sigma Black Belt.

11 granted US patents (US6849798B2; US7181972B2; US7187021B2; US7345280B2; US7381954B2, US8424292B2, US8602722B2, US8587660B2, US8702302B2, US8711340B2, US9091206B2)
Several US patent applications pending.

SPIE Proferssional: Opto-Diagnostics for Power Plants (http://spie.org/x48942.xml)
Publications (5)

SPIE Journal Paper | 6 October 2016
Rachit Sharma, Samhitha Poonacha, Anish Bekal, Sameer Vartak, Aniruddha Weling, Vinayak Tilak, Chayan Mitra
OE, Vol. 55, Issue 10, 104103, (October 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.10.104103
KEYWORDS: Raman spectroscopy, Gases, Calibration, Spectroscopy, Carbon monoxide, Raman scattering, Mirrors, Optical engineering, Signal analysis, Methane

SPIE Journal Paper | 14 March 2016
Rachit Sharma, Chayan Mitra, Vinayak Tilak
OE, Vol. 55, Issue 03, 037106, (March 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.3.037106
KEYWORDS: Semiconductor lasers, Diodes, Methane, Modulation, Absorption, Absorbance, Sensors, Gases, Hydrogen, Optical engineering

Proceedings Article | 13 May 2015 Paper
R. Sharma, S. Maity, A. Bekal, S. Vartak, A. Sridharan, C. Mitra
Proceedings Volume 9491, 94910D (2015) https://doi.org/10.1117/12.2178117
KEYWORDS: Sensors, Spectroscopy, Environmental sensing, Laser spectroscopy, Control systems, Receivers, Optical sensors, Absorption, Photodiodes, Modulation

Proceedings Article | 2 September 2010 Paper
Sandip Maity, Ayan Banerjee, Chayan Mitra
Proceedings Volume 7792, 77920D (2010) https://doi.org/10.1117/12.856785
KEYWORDS: Metals, Reflectivity, Temperature metrology, Speckle pattern, Surface finishing, Polishing, Surface roughness, Aluminum, Photodiodes, Specular reflections

Proceedings Article | 14 May 2010 Paper
Chayan Mitra, Ayan Banerjee, Sandip Maity, Norman Turnquist
Proceedings Volume 7726, 772619 (2010) https://doi.org/10.1117/12.853221
KEYWORDS: Metals, Reflectivity, Temperature metrology, Aluminum, Electrons, Combustion, Plasma, Environmental sensing, Surface properties, Phonons

Conference Committee Involvement (1)
IEEE ECCE
17 September 2011 |
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