Chia Hua Lin
Engineer at Macronix International Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 29 March 2013 Paper
C. Chen, C. Lin, C. Huang, Elvis Yang, T. Yang, Chih-Yuan Lu
Proceedings Volume 8682, 86821P (2013) https://doi.org/10.1117/12.2010755
KEYWORDS: Diffusion, Contamination, Optical lithography, Manufacturing, Semiconducting wafers, Compact discs, Photoresist processing, Polymers, Printing, Critical dimension metrology

Proceedings Article | 21 April 2011 Paper
C. H. Lin, T. H. Yang, Chih-Yuan Lu, K. C. Chen, C. H. Huang, Elvis Yang
Proceedings Volume 7971, 79712C (2011) https://doi.org/10.1117/12.879195
KEYWORDS: Etching, Photomasks, Photoresist processing, Optical lithography, Semiconducting wafers, Printing, Image processing, Critical dimension metrology, Coating, Reflectivity

Proceedings Article | 29 January 2007 Paper
Proceedings Volume 6508, 65080U (2007) https://doi.org/10.1117/12.703484
KEYWORDS: Silver, Scalable video coding, Video, Computer programming, Motion models, Radon, Motion estimation, Detection and tracking algorithms, Digital filtering, Performance modeling

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