Mr. Cui Hui Profile

Cui Hui

at Shanghai Institute of Optics and Fine Mechanics

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 22 September 2014 Paper

Hui Cui, Shijie Liu, Yuanan Zhao, Jie Liu, Jun He

Proceedings Volume 9238, 92380H (2014) https://doi.org/10.1117/12.2073535

KEYWORDS: Microscopy, Light scattering, Visibility, Microscopes, Diffraction, Damage detection, Objectives, Scattering, Image processing, Polishing

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Keywords/Phrases