Mr. Daniel Mansfield Profile

Daniel Mansfield

Research Manager/Company Physicist at Taylor Hobson

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Publications (7)

Proceedings Article | 27 February 2016 Paper

The development of thin film metrology by coherence scanning interferometry

Hirokazu Yoshino, Roger Smith, John Walls, Daniel Mansfield

Proceedings Volume 9749, 97490P (2016) https://doi.org/10.1117/12.2222883

KEYWORDS: Thin films, Refractive index, Interferometry, Metrology, Optical interferometry, Ellipsometry, 3D metrology, Optical testing, Surface roughness, Interfaces, Objectives, Silicon, Radium, Light sources, Silica

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Proceedings Article | 10 May 2014 Paper

Chromatic confocal microscope using hybrid aspheric diffractive lenses

Mathieu Rayer, Daniel Mansfield

Proceedings Volume 9130, 91300Z (2014) https://doi.org/10.1117/12.2048691

KEYWORDS: Colorimetry, Confocal microscopy, Aspheric lenses, Microscopes, Optics manufacturing, Single point diamond turning, Chromatic aberrations, Manufacturing, Optical design, Lens design

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Proceedings Article | 8 May 2012 Paper

Application of linear systems theory to characterize coherence scanning interferometry

Rahul Mandal, Kanik Palodhi, Jeremy Coupland, Richard Leach, Daniel Mansfield

Proceedings Volume 8430, 84300T (2012) https://doi.org/10.1117/12.922435

KEYWORDS: Point spread functions, Optical spheres, Electronic filtering, Calibration, Mercury, Spherical lenses, Interferometry, Linear filtering, Image filtering, Refractive index

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Proceedings Article | 25 September 2008 Paper

Extraction of film interface surfaces from scanning white light interferometry

Daniel Mansfield

Proceedings Volume 7101, 71010U (2008) https://doi.org/10.1117/12.797978

KEYWORDS: Interfaces, Atomic force microscopy, Thin films, Glasses, Optical interferometry, Reflectivity, Spectrophotometry, Modulation, Silicon, Reflection

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Proceedings Article | 14 May 2007 Paper

Thin film extraction from scanning white light interferometry

Daniel Mansfield

Proceedings Volume 10316, 1031626 (2007) https://doi.org/10.1117/12.736523

KEYWORDS: Thin films, Optical interferometry, Multilayers, Refractive index, Silica, Interferometry, Thin film deposition, Reflection, Reflectivity, Chromium

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Proceedings Article | 3 May 2006 Paper

The distorted helix: thin film extraction from scanning white light interferometry

Daniel Mansfield

Proceedings Volume 6186, 61860O (2006) https://doi.org/10.1117/12.664036

KEYWORDS: Thin films, Reflectivity, Adaptive optics, Silicon, Optical interferometry, Refractive index, Multilayers, Solids, Spectrophotometry, Thin film coatings

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Proceedings Article | 1 April 1992 Paper

Surface characterisation via optical diffraction

Daniel Mansfield

Proceedings Volume 1573, (1992) https://doi.org/10.1117/12.57758

KEYWORDS: Diffraction, Charge-coupled devices, Manufacturing, Convolution, Diffraction gratings, Point spread functions, Optical filters, Far-field diffraction, Wavefronts, Sensors

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Showing 5 of 7 publications

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