Dr. Daniel J. L. Williams Profile

Dr. Daniel J. L. Williams

Optical Scientist

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 3 September 2015 Paper

Chromatic correction for a VIS-SWIR zoom lens using optical glasses

Yang Zhao, Daniel Williams, Peter McCarthy, Anthony Visconti, Julie Bentley, Duncan Moore

Proceedings Volume 9580, 95800E (2015) https://doi.org/10.1117/12.2187533

KEYWORDS: Glasses, Zoom lenses, Short wave infrared radiation, Chromatic aberrations, Lens design, Colorimetry, Infrared imaging, Code v, Infrared radiation, Visible radiation

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Proceedings Article | 3 September 2015 Paper

Optical design study of a VIS-SWIR 3X zoom lens

Rebecca Berman, James Corsetti, Kejia Fang, Eryn Fenning, Peter McCarthy, Greg Schmidt, Anthony Visconti, Daniel Williams, Anthony Yee, Yang Zhao, Julie Bentley, Duncan Moore, Craig Olson

Proceedings Volume 9580, 95800D (2015) https://doi.org/10.1117/12.2187103

KEYWORDS: Zoom lenses, Short wave infrared radiation, Chemical elements, Lens design, Optical design, Diffraction, Modulation transfer functions, Optical filters, GRIN lenses, Chromatic aberrations

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Proceedings Article | 3 September 2015 Paper

New tools for finding first-order zoom lens solutions and the analysis of zoom lenses during the design process

Anthony Yee, Daniel Williams, Gustavo Gandara-Montano, Peter McCarthy, Julie Bentley, Duncan Moore

Proceedings Volume 9580, 958006 (2015) https://doi.org/10.1117/12.2186780

KEYWORDS: Zoom lenses, Lens design, Lenses, Code v, Software development, MATLAB, Modulation transfer functions, Visible radiation, Short wave infrared radiation, Glasses

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Proceedings Article | 17 December 2014 Paper

Optical Design Study in the 1-5μm Spectral Band with Gradient-Index Materials

Peter McCarthy, Rebecca Berman, Daniel Williams, Anthony Yee, Duncan Moore

Proceedings Volume 9293, 92930X (2014) https://doi.org/10.1117/12.2072692

KEYWORDS: GRIN lenses, Lens design, Colorimetry, Chalcogenides, Chemical elements, Glasses, Optical design, Gradient-index optics, Zinc, Imaging systems

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Conference Committee Involvement (2)

Dimensional Optical Metrology and Inspection for Practical Applications IX

27 April 2020 | Online Only, California, United States

Dimensional Optical Metrology and Inspection for Practical Applications VIII

16 April 2019 | Baltimore, MD, United States

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