David H. Stark
President
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 January 2003 Paper
Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.476338
KEYWORDS: Glasses, Metals, Diffusion, Microopto electromechanical systems, Temperature metrology, Manufacturing, Packaging, Polishing, Annealing, Reliability

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