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Dawoon E. Kim
at INAF/IAPS
SPIE Involvement:
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Publications (1)
Proceedings Article | 5 October 2023 Presentation + Paper
In-flight monitoring and calibration of the x-ray polarimeters on board IXPE: year two
John Rankin, Fabio Muleri, Riccardo Ferrazzoli, Luca Baldini, Wayne Baumgartner, Enrico Costa, Ettore Del Monte, Alessandro Di Marco, Kurt Dietz, Steven Ehlert, Sergio Fabiani, Philip Kaaret, Dawoon Kim, Jeffery Kolodziejczak, Fabio La Monaca, Luca Latronico, Carlo Lefevre, Alberto Manfreda, Stephen O'Dell, Matteo Perri, Simonetta Puccetti, Brian Ramsey, Ajay Ratheesh, Alda Rubini, Carmelo Sgrò, Paolo Soffitta, Doug Swartz, Allyn Tennant, Alessio Trois, Martin Weisskopf
Proceedings Volume 12678, 126780D (2023) https://doi.org/10.1117/12.2677264
KEYWORDS: Calibration, X-rays, Polarization, Modulation, Polarimetry, X-ray detectors, X-ray optics, X-ray imaging, X-ray astronomy
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