Mr. Elias G. Papadopoulos Profile

Elias G. Papadopoulos

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Publications (3)

Proceedings Article | 22 August 2024 Poster

Alignment, calibration, and the first flight of the Rockets for Extended Source X-ray Spectroscopy

Ross McCurdy, Drew Miles, James Tutt, Randall McEntaffer, Tyler Anderson, Logan Baker, Michael Betts, Katherine Brooks, Chad Eichfeld, Gianna Gagliardi, Fabien Grise, Gabrielle Hernandez, Christopher Hillman, Keir Hunter, Joseph Kang, Michael Labella, Bridget O'Meara, Jessica Mondoskin, Bailey Myers, Eli Papadopoulos, Nestor Pelaez, Vincent Smedile, Daniel Washington, Joseph Weston, Taylor Wood, Natalie Zinski

Proceedings Volume 13093, 130937M (2024) https://doi.org/10.1117/12.3020310

Proceedings Article | 21 August 2024 Poster + Paper

The Rockets for Extended-source X-ray Spectroscopy: instrument updates, results from the first flight, and future outlook

Drew Miles, Ross McCurdy, James Tutt, Jessica Mondoskin, Keir Hunter, Katherine Brooks, Daniel Washington, Randall McEntaffer, Tyler Anderson, Logan Baker, Michael Betts, Christopher Hillman, Joseph Weston, Natalie Zinski, Chad Eichfeld, Gianna Gagliardi, Juan Rojas González, Fabien Grisé, Sarah Hawks, Gabrielle Hernandez, Joseph Kang, Michael Labella, Jake McCoy, Bridget O'Meara, Bailey Myers, Eli Papadopoulos, Nestor Pelaez, Vincent Smedile, Adam Stone, Taylor Wood

Proceedings Volume 13093, 1309373 (2024) https://doi.org/10.1117/12.3020368

KEYWORDS: Equipment, X-rays, Rockets, Spectrographs, X-ray detectors, CMOS sensors, Blazed gratings, Reflection gratings, X-ray astronomy, X-ray telescopes

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Proceedings Article | 29 August 2022 Poster

Evaluating stress and reflectance of novel materials for use as reflective layers on X-ray gratings

Taylor Wood, Fabien Grisé, Jake McCoy, Elias Papadopoulos, Darren Pagan, Takashi Okajima, Mehmet Hazar Seren, Randall McEntaffer

Proceedings Volume 12181, 121814V (2022) https://doi.org/10.1117/12.2630285

KEYWORDS: Reflectivity, X-rays, Thin films, Mirrors, Thin film coatings, Coating, X-ray telescopes, X-ray optics, Spectral resolution, Semiconducting wafers

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