Absolute diffuse reflectance measurements may be carried out by means of both integrating sphere and goniometer- based methods. At the National Research Council of Canada, the scale of absolute diffuse spectral reflectance is currently realized in the UV/VIS/NIR range using the modified Sharp-Little integrating sphere method. To ex- tend the wavelength range and improve instrument performance, a new absolute reflectometer facility is presently being constructed. The new system features a monochromator-based tunable light source, interchangeable detector systems (PMT, Si, and extended InGaAs) and a custom polytetrafluoroethylene integrating sphere. Aspects of the sphere aimed at mitigating the effects of sphere asymmetry and sample recess will be discussed. Data characterizing the wavelength scale, bandpass, and linearity of the new system will also be presented.
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