Eric Kaltenbacher
SPIE Involvement:
Author | Instructor
Publications (6)

Proceedings Article | 16 October 2008 Paper
Lori Adornato, Eric Kaltenbacher, Robert Byrne, Xuewu Liu, Regina Easley
Proceedings Volume 7112, 71120R (2008) https://doi.org/10.1117/12.802616
KEYWORDS: Chemical analysis, Waveguides, Absorbance, Sensors, Luminescence, Water, Statistical analysis, Lamps, Spectroscopy, Oxygen

Proceedings Article | 3 May 2007 Paper
Weidong Wang, Scott Samson, Rahul Agarwal, John Bumgarner, Ray Hazen, Sunny Kedia, Gino Gonzalez, Larry Langebrake, Christel Munoz, Eric Kaltenbacher
Proceedings Volume 6556, 65560N (2007) https://doi.org/10.1117/12.721203
KEYWORDS: Sensors, Mirrors, Microsensors, Microelectromechanical systems, Microopto electromechanical systems, Packaging, Finite element methods, Telecommunications, Silicon, Humidity

Proceedings Article | 19 May 2005 Paper
Kendall Carder, Phillip Reinersman, David Costello, Eric Kaltenbacher, John Kloske, Martin Montes
Proceedings Volume 5780, (2005) https://doi.org/10.1117/12.606856
KEYWORDS: Ocean optics, Inspection, Coastal modeling, 3D modeling, Sensors, Optical inspection, Data modeling, Monte Carlo methods, Environmental sensing, Laser range finders

Proceedings Article | 7 June 1996 Paper
Proceedings Volume 2751, (1996) https://doi.org/10.1117/12.242018
KEYWORDS: Image resolution, Reconstruction algorithms, Image registration, Image quality, Infrared imaging, Image processing, Infrared radiation, Image restoration, Statistical analysis, Infrared detectors

Proceedings Article | 28 May 1993 Paper
Proceedings Volume 1821, (1993) https://doi.org/10.1117/12.145560
KEYWORDS: Detector arrays, Diffraction, Sensors, Semiconductor lasers, Light emitting diodes, Light sources, Motion measurement, Thermal effects, Manufacturing, Head

Showing 5 of 6 publications
Conference Committee Involvement (2)
Acquisition, Tracking, Pointing, and Laser Systems Technologies XXV
25 April 2011 | Orlando, Florida, United States
Acquisition, Tracking, Pointing, and Laser Systems Technologies XXIV
5 April 2010 | Orlando, Florida, United States
Course Instructor
SC1177: Practical Guide to Spectral Measurements
Have you asked questions such as: “Is there a less expensive alternative to costly laboratory spectrophotometers? “ or “What components should I use to build my own spectral measurement system?” If so, you will benefit from this course. In it, you will learn the fundamentals for designing, building and using a custom system for spectroscopic measurements using off-the-shelf components. The course will begin with a short introduction on spectroscopy theory, review basic optical components and their use, and conclude with examples of hardware setups ranging from the ultraviolet to the near infrared. A primary goal of this course is to demystify the creation of an effective spectroscopic solution optimized for your needs.
SC609: Basic Optics for Non-Optics Personnel
This course will provide the technical manager, sales engineering, marketing staff, or other non-optics personnel with a basic, non-mathematical introduction to the terms, specifications, and concepts used in optical technology to facilitate effective communication with optics professionals on a functional level. Topics to be covered include basic concepts such as imaging, interference, diffraction, polarization and aberrations, definitions relating to color and optical quality, and an overview of the basic measures of optical performance such as MTF and wavefront error. The material will be presented with a minimal amount of math, rather emphasizing working concepts, definitions, rules of thumb, and visual interpretation of specifications. Specific applications will include defining basic imaging needs such as magnification, depth-of-field, and MTF as well as the definitions of radiometric terms.
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