Eunchong Baek
at SAMSUNG Electro-Mechanics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 May 2024 Poster + Paper
Dael Na, Jaewon Lee, Minkyu Choi, Eunchong Baek, Howuk Kim
Proceedings Volume 12951, 129512H (2024) https://doi.org/10.1117/12.3010809
KEYWORDS: Signal processing, Ceramics, Capacitors, Dielectrics, Manufacturing, Damage detection, Nondestructive evaluation

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