A very simple class of measurements based upon interactions of pairs of electrons called near zero field magnetoresistance (NZFMR) spectroscopy has much of the analytical power of much more complex electron paramagnetic techniques in identifying the physical and chemical nature of point defects which play important roles in the operation of a wide variety of solid state devices. We show that this very simple measurement can provide information about hyperfine interactions with dominating defects in technologically important devices.
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