Prof. Fionn D. Murtagh
Director of Information and Communications Technology at Science Foundation Ireland
SPIE Involvement:
Author | Instructor
Publications (22)

Proceedings Article | 3 June 2005 Paper
D. Morrin, N. McMillan, K. Beverley, M. O'Neill, B. O'Rourke, G. Dunne, S. Riedel, A. Augousti, J. Mason, F. Murtagh, M. Kokuer
Proceedings Volume 5826, (2005) https://doi.org/10.1117/12.605525
KEYWORDS: Liquids, Refractive index, Bioalcohols, Roads, Surface properties, Light emitting diodes, Reflection, Physics, Life sciences, Computer science

Proceedings Article | 1 June 2005 Paper
Proceedings Volume 5823, (2005) https://doi.org/10.1117/12.606077
KEYWORDS: Data mining, Data modeling, Visualization, Data acquisition, Data processing, Software development, Mining, Statistical analysis, Mathematical modeling, Raman spectroscopy

Proceedings Article | 1 June 2005 Paper
Proceedings Volume 5823, (2005) https://doi.org/10.1117/12.607223
KEYWORDS: Image segmentation, Wavelets, Biomedical optics, 3D modeling, Magnetic resonance imaging, Positron emission tomography, Medical imaging, 3D image processing, Wavelet transforms, Image processing algorithms and systems

Proceedings Article | 1 June 2005 Paper
Proceedings Volume 5823, (2005) https://doi.org/10.1117/12.605092
KEYWORDS: Image registration, Statistical analysis, Magnetic resonance imaging, Error analysis, Statistical modeling, Image information entropy, Computed tomography, Image segmentation, Distortion, Electronics

Proceedings Article | 1 June 2005 Paper
G. Doyle, N. McMillan, F. Murtagh, M. O'Neill, S. Riedel, T. Perova, S. Unnikrishnan, R. Moore
Proceedings Volume 5823, (2005) https://doi.org/10.1117/12.606073
KEYWORDS: Raman spectroscopy, Data mining, Visualization, Data modeling, Spectroscopy, Statistical analysis, Computer science, Semiconductors, Software development, Algorithm development

Showing 5 of 22 publications
Proceedings Volume Editor (4)

SPIE Conference Volume | 1 June 2005

SPIE Conference Volume | 19 December 2002

SPIE Conference Volume | 1 November 2001

Conference Committee Involvement (4)
Imaging and Vision
5 April 2005 | Dublin, Ireland
Optical Metrology,Imaging, and Machine Vision
5 September 2002 | Galway, Ireland
Astronomical Data Analysis II
27 August 2002 | Waikoloa, Hawai'i, United States
Astronomical Data Analysis
2 August 2001 | San Diego, CA, United States
Course Instructor
SC137: Multiscale Analysis Methods in Astronomy and Engineering
Multiscale analysis methods, including wavelet transforms, used for image enhancement, faint feature recognition, image content characterization and fusion are presented in this material. Embedded applications in object detection, image database operations, image and signal compression and transmission, and process control are also discussed. This course explains how image and signal processing methods are used in science operations, product development and visual inspection.
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