Dr. Francesco Dell'Endice
Technology Entrepreneur/CEO and Board Member at QualySense AG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 May 2007 Paper
Proceedings Volume 6565, 65651F (2007) https://doi.org/10.1117/12.718591
KEYWORDS: Sensors, Signal to noise ratio, Short wave infrared radiation, Prisms, Charge-coupled devices, Distortion, Spectroscopy, Hyperspectral imaging, Scanners, Point spread functions

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