Dr. Hansaem Park
at Samsung Electronics Co., Ltd.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 129550Y (2024) https://doi.org/10.1117/12.3009407
KEYWORDS: Image segmentation, Transmission electron microscopy, Image processing, Metrology, Electron microscopes, Active learning

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top