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Heiko Reinsch
at Physikalisch-Technische Bundesanstalt
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Publications (1)
Proceedings Article | 18 November 2019 Paper
Interferometric and deflectometric flatness metrology with nanometre measurement uncertainties for optics up to 1 metre at PTB
G. Ehret, H. Reinsch, M. Schulz
Proceedings Volume 11189, 1118905 (2019) https://doi.org/10.1117/12.2538872
KEYWORDS: Interferometry, Autocollimators, Deflectometry, Zerodur, Interferometers, Optical testing, Metrology, Fizeau interferometers
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