Helga Mayr
at IDM Systems
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 June 2009 Paper
Mark Hartwich, Norbert Höhn, Helga Mayr, Konrad Sandau, Ralph Stengler
Proceedings Volume 7389, 738921 (2009) https://doi.org/10.1117/12.827503
KEYWORDS: Image processing, Statistical analysis, Image analysis, Manufacturing, Composites, Microscopes, Polymers, Inspection, Standards development, Applied sciences

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