Hongbing Ren
at Southwest Jiaotong Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 September 2016 Paper
Hongbing Ren, Jinlong Lee, Xiaorong Gao
Proceedings Volume 9684, 96840J (2016) https://doi.org/10.1117/12.2245564
KEYWORDS: Phase measurement, 3D metrology, Fringe analysis, 3D image processing, Phase shift keying, Error analysis, Optical testing, Modulation, Image processing, Image interpolation

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