Huai-Hsuan Huang
at National Sun Yat-sen Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 August 2020 Poster + Paper
Proceedings Volume 11498, 114980X (2020) https://doi.org/10.1117/12.2572296
KEYWORDS: Fourier transforms, Inspection, Fringe analysis, Image sensors, 3D metrology

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