Hung-Liang Huang
Student at National Yang Ming Chiao Tung Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 August 2003 Paper
Proceedings Volume 5130, (2003) https://doi.org/10.1117/12.504255
KEYWORDS: Optical proximity correction, Reverse engineering, Silicon, Photomasks, Manufacturing, Databases, Semiconducting wafers, Data acquisition, Lithography, Image processing

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