CONFERENCE PROCEEDINGS
Advanced Search
Ian Aeby
Application Engineer at EMCORE Corp
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 10 October 2012 Paper
Designing reliability into a 1000X concentration CPV system through targeted stress testing
Michael Winter, Ian Aeby, James Foresi
Proceedings Volume 8468, 846805 (2012) https://doi.org/10.1117/12.928880
KEYWORDS: Receivers, Reliability, Humidity, Silicon, Concentrated solar cells, Optical inspection, Sun, Temperature metrology, Solar cells, Visualization
Proceedings Article | 14 March 2005 Paper
VCSELs for high-speed data communication in TO packages: pushing the envelope
Ian Aeby, Lei Yang, Olga Lavrova, Hai Ling, Doug Collins, Charlie Wang, Chiyu Liu, Thomas Whittington
Proceedings Volume 5737, (2005) https://doi.org/10.1117/12.601936
KEYWORDS: Vertical cavity surface emitting lasers, Data communications, Temperature metrology, Fiber optics, Near field optics, Fiber optic communications, Transceivers, Eye, Optical fibers, Reliability
Proceedings Article | 16 June 2004 Paper
Reliability of oxide VCSELs at Emcore
Christopher Helms, Ian Aeby, Wenlin Luo, Robert Herrick, Albert Yuen
Proceedings Volume 5364, (2004) https://doi.org/10.1117/12.539282
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Failure analysis, Manufacturing, Transceivers, Mirrors, Electroluminescence, Transmission electron microscopy, Semiconducting wafers
Proceedings Article | 17 June 2003 Paper
Highly reliable oxide VCSELs for datacom applications
Ian Aeby, Doug Collins, Brian Gibson, Christopher Helms, Hong Hou, Wenlin Lou, David Bossert, Charlie Wang
Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482633
KEYWORDS: Vertical cavity surface emitting lasers, Failure analysis, Semiconducting wafers, Reliability, Oxides, Data communications, Optical inspection, Bismuth, Data modeling, Accelerated life testing
Proceedings Article | 4 June 2002 Paper
Production of high-speed oxide-confined VCSEL arrays for datacom applications
David Bossert, Doug Collins, Ian Aeby, J. Bridget Clevenger, Christopher Helms, Wenlin Luo, Charlie Wang, Hong Hou
Proceedings Volume 4649, (2002) https://doi.org/10.1117/12.469228
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Picosecond phenomena, Resistance, Modulation, Data communications, Capacitance, Eye, Reliability, Temperature metrology
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top