Dr. Ionut Jepu
at INFLPR
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 30 August 2017 Presentation + Paper
Victor Ciupina, Eugeniu Vasile, Corneliu Porosnicu, Cristian Lungu, Rodica Vladoiu, Ionut Jepu, Aurelia Mandes, Virginia Dinca, Aureliana Caraiane, Virginia Nicolescu, Ovidiu Cupsa, Paul Dinca, Agripina Zaharia
Proceedings Volume 10356, 103560O (2017) https://doi.org/10.1117/12.2272579
KEYWORDS: Silicon carbide, Carbon, Silicon, Nitrogen, Multilayers, Silicon films, Transmission electron microscopy, Ions, Spectroscopy, Oxygen

Proceedings Article | 26 September 2016 Presentation + Paper
Victor Ciupina, Eugeniu Vasile, Corneliu Porosnicu, Gabriel Prodan, Cristian Lungu, Rodica Vladoiu, Ionut Jepu, Aurelia Mandes, Virginia Dinca, Aureliana Caraiane, Virginia Nicolescu, Paul Dinca, Agripina Zaharia
Proceedings Volume 9929, 992910 (2016) https://doi.org/10.1117/12.2237156
KEYWORDS: Oxidation, Silicon carbide, Carbon, Nitrogen, Transmission electron microscopy, Silicon, Resistance, Oxygen, Coating, Plasma

Proceedings Article | 20 August 2015 Presentation + Paper
Victor Ciupina, Cristian Lungu, Rodica Vladoiu, Gabriel Prodan, Stefan Antohe, Corneliu Porosnicu, Iuliana Stanescu, Ionut Jepu, Sorina Iftimie, Marius Belc, Aurelia Mandes, Virginia Dinca, Eugeniu Vasile, Valeriu Zarovski, Virginia Nicolescu, Aureliana Caraiane
Proceedings Volume 9558, 955808 (2015) https://doi.org/10.1117/12.2187362
KEYWORDS: Silicon, Silicon carbide, Ions, Nitrogen, Transmission electron microscopy, Plasma, Argon, Glasses, Etching, Nanostructures

Proceedings Article | 27 August 2014 Paper
Victor Ciupina, Cristian Lungu, Rodica Vladoiu, Gabriel Prodan, Stefan Antohe, Corneliu Porosnicu, Iuliana Stanescu, Ionut Jepu, Sorina Iftimie, Madalina Prodan, Aurelia Mandes, Virginia Dinca, Eugeniu Vasile, Valeriu Zarovski, Virginia Nicolescu
Proceedings Volume 9172, 91720Y (2014) https://doi.org/10.1117/12.2061186
KEYWORDS: Silicon carbide, Silicon, Crystals, Carbon, Thin films, Transmission electron microscopy, Coating, Glasses, Temperature metrology, Resistance

Proceedings Article | 19 September 2013 Paper
V. Ciupina, C. Lungu, R. Vladoiu, T-D. Epure, G. Prodan, C. Roşca, C. Porosnicu, I. Jepu, M. Belc, M. Prodan, I. Stanescu, C. Stefanov, M. Contulov, A. Mandes, V. Dinca, E. Vasile, V. Zarovschi, V. Nicolescu
Proceedings Volume 8818, 881807 (2013) https://doi.org/10.1117/12.2024018
KEYWORDS: Silicon carbide, Coating, Carbon, Resistance, Silicon, Oxygen, Crystals, Transmission electron microscopy, Scanning transmission electron microscopy, Oxidation

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