Mr. Jagannath Dayalu Profile

Jagannath Dayalu

at Univ of Rochester

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Author

Publications (4)

Proceedings Article | 13 May 2015 Paper

Optical simulation of terahertz antenna using finite difference time domain method

Chao Zhang, Zoran Ninkov, Greg Fertig, Robert Kremens, Andrew Sacco, Daniel Newman, Kenneth Fourspring, Paul Lee, Zeljko Ignjatovic, Judy Pipher, Craig McMurtry, Jagannath Dayalu

Proceedings Volume 9483, 94830D (2015) https://doi.org/10.1117/12.2179211

KEYWORDS: Antennas, Absorption, Terahertz radiation, Finite-difference time-domain method, Resistors, Optical simulations, Imaging systems, Sensors, Silicon, Metals

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Proceedings Article | 13 May 2015 Paper

Transmission imaging measurements at 188 GHz with 0.35µn CMOS technology

Andrew Sacco, J. Daniel Newman, Paul P. Lee, Kenneth Fourspring, John Osborn, Robert Fiete, Mark Bocko, Zeljko Ignjatovic, Judith Pipher, Craig McMurtry, Xi-Cheng Zhang, Jagannath Dayalu, Katherine Seery, Chao Zhang, Sahil Bhandari, Zoran Ninkov

Proceedings Volume 9483, 94830U (2015) https://doi.org/10.1117/12.2178512

KEYWORDS: Sensors, Imaging systems, Terahertz radiation, Antennas, Solids, CMOS technology, Standoff detection, Signal detection, Raster graphics, Interference (communication)

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Proceedings Article | 21 May 2014 Paper

T-ray detection in 0.35-um CMOS technology

Gregory Fertig, Zoran Ninkov, Mark Bocko, Jagannath Dayalu, Kenny Fourspring, Zeljko Ignjatovic, Paul Lee, Craig McMurtry, J. Daniel Newman, Judith Pipher, Andrew Sacco, Chao Zhang

Proceedings Volume 9102, 91020P (2014) https://doi.org/10.1117/12.2050754

KEYWORDS: Field effect transistors, Transistors, Camera shutters, Resistance, Terahertz radiation, CMOS sensors, Imaging systems, Silicon, Sensors, CMOS technology

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Proceedings Article | 21 May 2014 Paper

THz imaging Si MOSFET system design at 215 GHz

Proceedings Volume 9102, 91020Q (2014) https://doi.org/10.1117/12.2050906

KEYWORDS: Antennas, Imaging systems, Terahertz radiation, Silicon, Sensors, Optical design, Field effect transistors, Near field, CMOS sensors, Imaging spectroscopy

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